IEC TS 62804-1:2015 Photovoltaic (PV) modules - Test methods for the detection of potential-induced degradation - Part 1: Crystalline silicon (Record no. 66625)
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fixed length control field | 00465 a2200145 4500 |
003 - CONTROL NUMBER IDENTIFIER | |
control field | OSt |
005 - DATE AND TIME OF LATEST TRANSACTION | |
control field | 20181120102623.0 |
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
fixed length control field | 181120b ||||| |||| 00| 0 eng d |
040 ## - CATALOGING SOURCE | |
Transcribing agency | 0 |
100 ## - MAIN ENTRY--PERSONAL NAME | |
Personal name | International Electrotechnical Commission |
245 ## - TITLE STATEMENT | |
Title | IEC TS 62804-1:2015 Photovoltaic (PV) modules - Test methods for the detection of potential-induced degradation - Part 1: Crystalline silicon |
250 ## - EDITION STATEMENT | |
Edition statement | Ed. 1.0 |
260 ## - PUBLICATION, DISTRIBUTION, ETC. | |
Name of publisher, distributor, etc. | IEC |
Date of publication, distribution, etc. | 2015 |
942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
Source of classification or shelving scheme | |
Koha item type | Standards |
Withdrawn status | Lost status | Source of classification or shelving scheme | Damaged status | Not for loan | Permanent Location | Current Location | Date acquired | Full call number | Barcode | Date last seen | Price effective from | Koha item type | Public note |
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Central Power Research Institute | Central Power Research Institute | 2018-10-22 | 28517 | 28517 | 2018-10-22 | 2018-10-22 | Standards | CD 767 |