IEC: 68 - 2 - 29 - 1968; Basic environmental testing procedures for electronic components and electronic equipment Part 2 tests- test Eb; Bump
Contributor(s): International Electrotechnical Commission.
Material type: BookPublisher: Geneva IEC 1968Description: 15p.Item type | Current location | Home library | Call number | Status | Date due | Barcode |
---|---|---|---|---|---|---|
Text | Central Power Research Institute | Central Power Research Institute | Available | 9944 |
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