Search history [x]
Your search returned 705 results.
by Byerly, Richard T.
by Institute of Electrical and Electronics Engineers.
by Harden, John D | IEEE.
by Institute of Electrical and Electronics Engineers, Inc.
by Willson, Alan N., Ed.
by Mitra, Sanjit K., Ed.
by Lin, Wen C., Ed.
by Schoeffler, James D | Temple, Ronald H.
by American National Standards Institutions, Inc.
by INSTITUTE OF ELETRICAL AND ELECTRONICS ENGINEERS.
by INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS.
Powered by Koha