000 00314nam a2200085Ia 4500
008 180131b2010 xxu||||| |||| 00| 0 eng d
080 _a
_b
100 _aInternational Electrotechnical Commission
245 _aIec: 60060-2- 2010; High- Voltage Test Techniques - Part 2: Measuring Systems
260 _a
_bInternational Electrotechnical Commission
_c2010
999 _c57943
_d57943