000 00299nam a2200085Ia 4500
008 180131b2010 xxu||||| |||| 00| 0 eng d
080 _a
_b
100 _aInternational Electrotechnical Commission
245 _aIec: 61000-4-3 (Ed-3.2) - 2010-04:Electromagnetic Compatibility (Emc)- Part 4-3: Testing And Measure
260 _a
_bIEC
_c2010
999 _c62697
_d62697