| 000 | 00371 a2200085 4500 | ||
|---|---|---|---|
| 100 | _aInternational Electrotechnical Commission | ||
| 245 | _aIEC 61000-4-11:2004+AMD1:2017 CSV; Electromagnetic compatibility (EMC) - Part 4-11: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests | ||
| 250 | _aEd.2.1 | ||
| 260 |
_bIEC _c2017 |
||
| 999 |
_c66663 _d66663 |
||